核心参数

特性

来自微米级光斑的量级通量增益

• 与紧凑型低功率电源集成，可提供相当于旋转阳极源的通量

• 光谱带宽较宽：50 eV - 50 KeV

• 点对点会聚光束

• 点对平行光束

• 可定制设计机壳

优势

极高的通量密度

• 提高了空间分辨率

• 非常适合分析形状不规则、未经制备或低阻抗的样品

优于电子探针 X 射线分析：

• 增强检测灵敏度

• 无需特殊样品制备

• 在空气中操作

技术参数：

Focusing Optics								Applications include micro-XRF forelemental mapping， plating thickness and fine feature analysis.
Working distance (mm)	2	4	9	20	50	100	200
Focal spot size* (μm， FWHM，17.4keV)	7	15	25	45	100	180	300
Intensity gain* (vs а plnhole collimator of same size， 100mm fгom the source)	6000	4500	3500	2000	800	300	120

Note: *With а 100μm X-ray source.

Half-focusing Optics (XRF/XAS)						Applications include micro XRF， micro XAS， and confocal XRF.
Working distance (mm)	2	4	9	20	50
Focal spot size* (μm， FWHM，17.4keV)	7	15	25	45	100
Intensity gain* (vs a pinhole collimatorof same size)	850	550	400	200	80

Note: *With an incident beam of 2mm in diameter and a divergent angle of <0.5mrad

Collimating/Parallel Beam Optics (XRD/WDS/XRF)

Applications include powder XRD，

texture and stress analysis， WDS and

confocal XRF.

Output beam diameter(mm)

0.5

Intensity gain*

130

250

370

470

680

850

Note: *With а 50μm X-ray source at 8keV， The lFD of the optics is 18mm and the output divergent angle is 0.2 degree.

Figure 1: 有机玻璃散射X射线光谱

Comparison of MXRF spectra generated using a focusing polycapillary optic and a pinhole aperture. The spectra was collected by scattering a Mo beam off Plexiglas.

Figure 2: 采用光晕抑制型毛细管实现高分辨率 XRF Mapping

Comparison of MXRF spectra generated using a focusing polycapillary optic and a pinhole aperture. The spectra was collected by scattering a Mo beam off Plexiglas.

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