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The X-Prep® fixture adapter is also secured to the motorized stage on the X-Prep® Vision™, ensuring the measurement/tool control coordinates remain aligned when transferred between systems.
A library with over 130 materials (i.e., GaAs, InGaAs, SiC, Sapphire/Al2O3, InP, SiGe, GaN, photo-resist) is included with every system.
Meaurement & Observation - How it Works
IR light is focused onto a sample, and a unique signal based on the refractive index of the material is created. The return signal is analyzed by the software to produce a thickness value.
Meauring Below 10 μm Thickness
For applications requiring thinning to less than 10 μm, precise measurement is possible only by adding the visible light spectrometer accessory.
Multipoint scan or single-point thickness measurement | 10 microns to full thickness (1 mm) range of measurement (15 nm to 1 mm thick when configured with #15-51000 Spectrometer) | |
Motorized, automatic X/Y/Z (auto-focus) with <1s acquisition time | Automatic edge and corner detection aligns measurement grid with X-Prep® - including theta correction | |
Edge exclusion with X/Y input | Stage fitted with X-Prep® fixture adapter | |
"Drive to Coordinate" software navigation | Viewing of either 2D plot/map or 3D graph | |
Supplied with Allied proprietary X-Correct™ software | CCD camera (#15-50020) must be purchased separately if not purchasing Visible Light Spectrometer (#15-51000) | |
Roughness - 15 micron finish | 100 mm x 100 mm stage travel | |
Software automation extendable through .NET | Data export using standard Windows methods | |
One (1) year warranty | Dimensions: 14" W x 17" D x 19" H (355 x 431 x 483 mm) |
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