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名 称：上海微纳国际贸易有限公司认 证：工商信息已核实
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Optimal TEM specimen preparation done First Time Right
Achieve ultimate specimen quality – free from amorphous and implanted layers
Complements FIB technology
Milling without introduction of artifacts
Advanced detector technology for imaging and precise endpoint detection
In situ imaging with ions and electrons
Microscope connectivity for risk-free specimen handling
Adds capability and capacity
Fast， reliable and easy to use
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